Electron Microscopy Laboratory

(FEI) THERMO FISHER SCIENTIFIC QUATTRO S ESEM SCANNING ELECTRON MICROSCOPE

Imaging of micro and nano structures is an indispensable part of R&D studies. The FEG (Field Emission Gun) Scanning Electron Microscope (SEM) in our Electron Microscopy Laboratory allows us to visualize materials in micro and nano dimensions, and elemental compositions can be determined with EDS (Energy Dispersive X-ray Spectroscopy).

Images can be taken at high resolutions up to 1.0 nm resolution, depending on the sample, and a magnification of 1,000,000x can be achieved with the FEG-SEM system.

Thanks to the navigation camera of the system, "color image of the sample table and all of the stups together with the samples" can be taken. In this way, the determination of the researcher's place of interest takes a very short time and fast results can be given.

The MAPS Correlation feature in our system, makes it possible to correlate images and samples from different microscopes (fluorescent, light microscope, confocal microscope, IR & Raman microscope, etc.). This way, it is possible to visualize the places marked and determined with different techniques with SE and BSE detectors at high magnification and resolution.

Different Analysis Modes:

High Vacuum Mode: Conductive samples, powder samples, thin films, coated insulator samples.

1.0 nm@ 30 kV resolution image can be obtained.

DLow Vacuum Mode: Uncoated insulating samples, polymers, glass samples, etc.

1.3nm@ 30 kV resolution image can be obtained.

ESEM: Biological samples, samples containing moisture.

1.3nm@ 30kV resolution image can be obtained.

(FEI) THERMO FISHER SCIENTIFIC TALOS L120C (TEM) TRANSMISSION ELECTRON MICROSCOPE

Thin tissue sections, nano particles, graphene, etc. prepared in ultra microtome system samples can be run with 120kV (TEM) Transmissive Electron Microscope installed in our laboratory. It is possible to obtain images with the highest contrast in the system equipped with C-TWIN Lens technology.

TALOS L120C TEM Device General Features:

TEM Line Resolution : 0.204 nm
TEM Point Resolution : < 0.37 nm
TEM Magnification Range : 25 – 650 kx
Alpha Tilt Angle (with standard holders) : -90° to +90°

GENERAL INFORMATION ABOUT THE ELECTRON MICROSCOPES IN OUR LABORATORY

(FEI) THERMO FISHER SCIENTIFIC QUATTRO S ESEM SCANNING ELECTRON MICROSCOPE
Imaging of micro and nano structures is an essential part of R&D studies. With the FEG (Field Emission Gun) Scanning Electron Microscope (SEM) in our Electron Microscopy Laboratory, materials can be imaged at the micro and nano scale, and their elemental compositions can be determined using EDS (Energy Dispersive X-ray Spectroscopy).

With the FEG-SEM system in our laboratory, high-resolution imaging can be achieved down to 1.0 nm, depending on the sample, and magnifications up to 1,000,000x can be attained.

Thanks to the system’s navigation camera, a coloured image of the entire sample stage and stubs along with the samples can be captured. This allows researchers to quickly locate the areas of interest, leading to faster results.

The MAPS Correlation feature of our system enables correlation between images and samples obtained from different microscopes (fluorescence, light microscopy, confocal microscopy, IR & Raman microscopy, etc.). This allows regions marked using different techniques to be imaged at high magnification and resolution with SE and BSE detectors.

Different Analysis Modes

High Vacuum Mode: Conductive samples, powder samples, thin films, coated insulating samples.

Imaging resolution: 1.0 nm @ 30 kV
Low Vacuum Mode: Uncoated insulating samples, polymers, glass samples, etc.
Imaging resolution: 1.3 nm @ 30 kV
ESEM (Environmental SEM): Biological samples, moisture-containing samples.
Imaging resolution: 1.3 nm @ 30 kV

(FEI) THERMO FISHER SCIENTIFIC TALOS L120C (TEM) TRANSMISSION ELECTRON MICROSCOPE
With the 120kV Transmission Electron Microscope (TEM) installed in our laboratory, ultra-thin tissue sections prepared with an ultramicrotome system, nanoparticles, graphene, and similar samples can be examined. The system, equipped with C-TWIN Lens technology, enables the acquisition of images with the highest contrast.

General Features of the TALOS L120C TEM System:
TEM Line Resolution: 0.204 nm
TEM Point Resolution: < 0.37 nm
TEM Magnification Range: 25 – 650 kx
Alpha Tilt Angle (with standard holders): -90° to +90°